Imperial College London
Dr Richard Chater

DrRichardChater

Faculty of Engineering, Department of Materials

Instrumentation Research Fellow, Surface Analysis
 
 
 
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Contact

 

+44 (0)20 7594 6740r.chater

 
 
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Location

 

LG62ARoyal School of MinesSouth Kensington Campus

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Summary

 

Publications

Publication Type
Year
to

171 results found

Graham GA, Kearsley AT, Butterworth AL, Bland PA, Burchell MJ, McPhail DS, Chater R, Grady MM, Wright IPet al., 2004, Extraction and microanalysis of cosmic dust captured during sample return missions: laboratory simulations, Kidlington, Scientific exploration, planetary protection, active experiments and dusty plasmas, 2nd world space congress/34th COSPAR scientific assembly, Houston, TX, 10 - 19 October 2002, Publisher: Pergamon-Elsevier Science Ltd, Pages: 2292-2298

Conference paper

McPhee WAG, McPhail DS, Chater RJ, Drennan J, Schaffer GBet al., 2003, Transmission electron microscopy sample preparation technique for sintered alloys, POWDER METALLURGY, Vol: 46, Pages: 257-258, ISSN: 0032-5899

Journal article

Ryan MP, Williams DE, Chater RJ, Hutton BM, McPhail DSet al., 2003, Metallurgy - Stainless-steel corrosion and MnS inclusions - Reply, NATURE, Vol: 424, Pages: 390-390, ISSN: 0028-0836

Journal article

Vannier RN, Chater RJ, Skinner SJ, Kilner JA, Mairesse Get al., 2003, Characterisation of the oxygen transfer in BIMEVOX membranes under applied current conditions, SOLID STATE IONICS, Vol: 160, Pages: 327-334, ISSN: 0167-2738

Journal article

Vannier RN, Skinner SJ, Chater RJ, Kilner JA, Mairesse Get al., 2003, Oxygen transfer in BIMEVOX materials, SOLID STATE IONICS, Vol: 160, Pages: 85-92, ISSN: 0167-2738

Journal article

Hallett K, Thickett D, McPhail DS, Chater RJet al., 2003, Application of SIMS to silver tarnish at the British Museum, 13th International Conference on Secondary Ion Mass Spectrometry and Related Topics (SIMS XIII), Publisher: ELSEVIER SCIENCE BV, Pages: 789-792, ISSN: 0169-4332

Conference paper

Alibhai AA, Chater RJ, McPhail DS, Shollock BAet al., 2003, Use of isotopic tracers and SIMS analysis for evaluating the oxidation behaviour of protective coatings on nickel based superalloys, 13th International Conference on Secondary Ion Mass Spectrometry and Related Topics (SIMS XIII), Publisher: ELSEVIER SCIENCE BV, Pages: 630-633, ISSN: 0169-4332

Conference paper

Srnanek R, Kovac J, Kinder R, Geurts J, Peternai L, McPhail DS, Fearn S, Chater R, Sciana B, Radziewicz D, Tlaczala Tet al., 2003, Micro-photoluminescence on bevelled samples - a method of assessing delta-doped layers, Physica Status Solidi C, Vol: C, Pages: 1055-1059, ISSN: 1610-1634

Journal article

Vannier RN, Capoen E, Pirovano C, Steil C, Nowogrocki G, Mairesse G, Chater RJ, Skinner SJ, Kilner JAet al., 2003, Oxide ion transport in Bismuth-based materials, Symposium on solid state ionics, MRS, Boston, MA, Publisher: Materials Research Society, Pages: 95-104

Conference paper

Graham GA, Chater RJ, McPhail DS, Kearsley AT, Lee MR, Kettle S, Wright IPet al., 2002, In situ sectioning and analysis of cosmic dust using focused ion beam microscopy., METEORITICS & PLANETARY SCIENCE, Vol: 37, Pages: A56-A56, ISSN: 1086-9379

Journal article

Ryan MP, Williams DE, Chater RJ, Hutton BM, McPhail DSet al., 2002, Why stainless steel corrodes, NATURE, Vol: 415, Pages: 770-774, ISSN: 0028-0836

Journal article

Srnanck R, Kinder R, Donoval D, Peternai L, Novotny I, Geurts J, McPhail DS, Chater R, Nemcsics Aet al., 2002, Chemical beveling of Si/SiGe structures for structure and material analysis by Raman spectroscopy, Pages: 195-198

Bevels through Si/SiGe structures were prepared by chemical etching. The surface of the bevels was smooth and bevel angles were in the range 10-4 rad. From the Raman spectra along the bevels the thickness and composition of SiGe alloys were determined and compared with photocurrent response spectrum of the structures.

Conference paper

Yanaka M, Henry BM, Roberts AP, Grovenor CRM, Briggs GAD, Sutton AP, Miyamoto T, Tsukahara Y, Takeda N, Chater RJet al., 2001, How cracks in SiO<i><sub>x</sub></i>-coated polyester films affect gas permeation, THIN SOLID FILMS, Vol: 397, Pages: 176-185, ISSN: 0040-6090

Journal article

Langford RM, Lee MJ, Wright SW, Judge CP, Chater RJ, Tate TJet al., 2001, Oxygen and indium diffusion into SiO<sub>2</sub> encapsulated polycrystalline CdSe films, JOURNAL OF ELECTRONIC MATERIALS, Vol: 30, Pages: 925-930, ISSN: 0361-5235

Journal article

Atkinson A, Chater RJ, Rudkin R, 2001, Oxygen diffusion and surface exchange in La<sub>0.8</sub>Sr<sub>0.2</sub>Fe<sub>0.8</sub>Cr<sub>0.2</sub>O<sub>3-δ</sub> under reducing conditions, SOLID STATE IONICS, Vol: 139, Pages: 233-240, ISSN: 0167-2738

Journal article

Gurnik P, Srnanek R, McPhail DS, Chater RJ, Fearn S, Harmatha L, Kordos P, Geurts J, Lalinsky Tet al., 2001, Characterization of delta-doped GaAs grown by molecular beam epitaxy, International symposium on electron devices for microwave and optoelectronic applications, Vienna Univ Technol, Vienna, Austria, Pages: 9-14

Conference paper

Vickridge IC, Kaitasov O, Chater RJ, Kilner JAet al., 2000, Silicon isotopic tracing with the <SUP>29</SUP>Si(p, γ) narrow resonance near 415 keV, 14th International Conference on Ion Beam Analysis/6th European Conference on Accelerators in Applied Research and Technology, Publisher: ELSEVIER SCIENCE BV, Pages: 441-445, ISSN: 0168-583X

Conference paper

Lee MJ, Langford RM, Wright SW, Judge CP, Chater RJet al., 2000, The Effect of Oxygen on the Properties of Encapsulated Polycrystalline CdSe films, Journal of Electronic Materials, Vol: 29, Pages: 418-425

Journal article

Langford RM, Lee MJ, Wright SW, Judge CP, Chater RJ, Tate TJet al., 2000, Effect of Copper and Chlorine on the Properties of SiO2 encapsulated Poltcrystalline CdSe Films, Journal of Electronic Materials, Vol: 29, Pages: 1319-1327

Journal article

Garriga-Majo DP, Shollock BA, McPhail DS, Chater RJ, Walker JFet al., 1999, Novel strategies for evaluating the degradation of protective coatings on superalloys, INTERNATIONAL JOURNAL OF INORGANIC MATERIALS, Vol: 1, Pages: 325-336, ISSN: 1466-6049

Journal article

Hughes M, McPhail DS, Chater RJ, Walker Jet al., 1999, High sensitivity FIB-SIMS analysis of semiconductor devices, Conference on Microscopy of Semiconducting Materials, Publisher: IOP PUBLISHING LTD, Pages: 603-606, ISSN: 0951-3248

Conference paper

Cohen LF, de Silva PSIPN, Malde N, Hossain AKMA, Thomas KA, Chater R, MacManus-Driscoll JD, Tate T, Mathur ND, Blamire MG, Evetts JEet al., 1998, Reentrant metal-insulator-type transition induced by high fluence chromium ion implantation of La<sub>0.7</sub>Ca<sub>0.3</sub>MnO<sub>3</sub> thin films, APPLIED PHYSICS LETTERS, Vol: 73, Pages: 1005-1007, ISSN: 0003-6951

Journal article

Montgomery NJ, MacManus-Driscoll JL, McPhail DS, Chater RJ, Moeckly B, Char Ket al., 1998, High-resolution secondary ion mass spectrometry depth profiling of superconducting thin films, 5th European Vacuum Conference (EVC 5) / 10th International Conference on Thin Films (ICTF 10), Publisher: ELSEVIER SCIENCE SA, Pages: 237-240, ISSN: 0040-6090

Conference paper

Henry BM, Roberts AP, Grovenor CRM, Sutton AP, Briggs GAD, Tsukahara Y, Yanaka M, Miyamoto T, Chater RJet al., 1998, Microstructural characterization of transparent silicon oxide permeation barrier coatings on PET, Pages: 434-439, ISSN: 0737-5921

The aim of this study was to correlate the microstructure and gas barrier performance of nanocomposite films. A range of SiOx layers of varying thickness (13 to 316 nm), deposited by electron beam evaporation on polyethylene terephthalate substrates, have been investigated. The gas barrier properties of the films have been measured for several gases, namely He, Ne, Ar and O. A variety of techniques have been used to microstructurally characterize the oxide coating. It was found that the barrier layer was uniform, amorphous and free of macro-scale defects. A theoretical model has been proposed that describes the SiOx layer as a solid with a pore size distribution of 2.7 to 4 angstroms. Using this model, it is possible to account for the gas transmission properties exhibited by the films.

Conference paper

De Silva PSIPN, Malde N, Hossain AKMA, Cohen LF, Thomas KA, Chater R, MacManus-Driscoll JD, Tate TJ, Mathur ND, Blamire MG, Evetts JEet al., 1998, Effects of chromium ion implantation on the magneto-transport properties of La<sub>0.7</sub>Ca<sub>0.3</sub>MnO<sub>3</sub> thin films, Symposium on Metallic Magnetic Oxides at the Materials-Research-Society Fall Meeting, Publisher: MATERIALS RESEARCH SOCIETY, Pages: 323-328, ISSN: 0272-9172

Conference paper

Coccia LG, Tyrrell GC, Kilner JA, Waller D, Chater RJ, Boyd IWet al., 1996, Pulsed laser deposition of novel materials for thin film solid oxide fuel cell applications: Ce0.9Gd0.1O1.95, La0.7Sr0.3CoOy and La0.7Sr0.3Co0.2Fe0.8Oy, 3rd International Conference on Laser Ablation (COLA 95), Publisher: ELSEVIER SCIENCE BV, Pages: 795-801, ISSN: 0169-4332

Conference paper

Li Y, Kilner JA, Chater RJ, Tate TJ, Jeynes C, Jafri ZHet al., 1996, SIMS, RBS, and ion channelling studies of 2H+ and 18O+ irradiated LaAlO3 (100) single crystal, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol: 118, Pages: 133-138

Journal article

LI YP, MARSH CD, NEJIM A, CHATER RJ, KILNER JA, HEMMENT PLFet al., 1995, SIMOX - PROCESSING, LAYER PARAMETERS DESIGN, AND DEFECTS CONTROL, 13th International Conference on the Application of Accelerators in Research and Industry, Publisher: ELSEVIER SCIENCE BV, Pages: 479-483, ISSN: 0168-583X

Conference paper

LI YP, KILNER JA, TATE TJ, LEE MJ, CHATER RJ, FOX H, DESOUZA RA, QUINCEY PGet al., 1995, SECONDARY-ION-MASS-SPECTROSCOPY STUDY OF OXYGEN TRACER DIFFUSION IN A C-AXIS-ORIENTED YBA(2)CU3O(7-DELTA) FILM, PHYSICAL REVIEW B, Vol: 51, Pages: 8498-8502, ISSN: 2469-9950

Journal article

LI YP, KILNER JA, CHATER RJ, NEJIM A, HEMMENT PLF, MARSH CD, BOOKER GRet al., 1994, OXYGEN ISOTOPIC EXCHANGE DURING THE ANNEALING OF LOW-ENERGY SIMOX LAYERS, 11th International Conference on Ion Beam Analysis (IBA-11), Publisher: ELSEVIER SCIENCE BV, Pages: 236-242, ISSN: 0168-583X

Conference paper

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