Imperial College London
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ProfessorRiccardoSapienza

Faculty of Natural Sciences, Department of Physics

Professor of Physics
 
 
 
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Contact

 

+44 (0)20 7594 9577r.sapienza Website

 
 
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Location

 

B913Blackett LaboratorySouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Dagdeviren:2021:10.1021/acs.nanolett.1c02853,
author = {Dagdeviren, OE and Glass, D and Sapienza, R and Cortes, E and Maier, SA and Parkin, IP and Grutter, P and Quesada-Cabrera, R},
doi = {10.1021/acs.nanolett.1c02853},
journal = {Nano Letters: a journal dedicated to nanoscience and nanotechnology},
pages = {8348--8354},
title = {The effect of photoinduced surface oxygen vacancies on the charge carrier dynamics in TiO2 films},
url = {http://dx.doi.org/10.1021/acs.nanolett.1c02853},
volume = {21},
year = {2021}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AB  - Metal-oxide semiconductors (MOS) are widely utilized for catalytic and photocatalytic applications in which the dynamics of charged carriers (e.g., electrons, holes) play important roles. Under operation conditions, photoinduced surface oxygen vacancies (PI-SOV) can greatly impact the dynamics of charge carriers. However, current knowledge regarding the effect of PI-SOV on the dynamics of hole migration in MOS films, such as titanium dioxide, is solely based upon volume-averaged measurements and/or vacuum conditions. This limits the basic understanding of hole-vacancy interactions, as they are not capable of revealing time-resolved variations during operation. Here, we measured the effect of PI-SOV on the dynamics of hole migration using time-resolved atomic force microscopy. Our findings demonstrate that the time constant associated with hole migration is strongly affected by PI-SOV, in a reversible manner. These results will nucleate an insightful understanding of the physics of hole dynamics and thus enable emerging technologies, facilitated by engineering hole-vacancy interactions.
AU  - Dagdeviren,OE
AU  - Glass,D
AU  - Sapienza,R
AU  - Cortes,E
AU  - Maier,SA
AU  - Parkin,IP
AU  - Grutter,P
AU  - Quesada-Cabrera,R
DO  - 10.1021/acs.nanolett.1c02853
EP  - 8354
PY  - 2021///
SN  - 1530-6984
SP  - 8348
TI  - The effect of photoinduced surface oxygen vacancies on the charge carrier dynamics in TiO2 films
T2  - Nano Letters: a journal dedicated to nanoscience and nanotechnology
UR  - http://dx.doi.org/10.1021/acs.nanolett.1c02853
UR  - http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000709549100058&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
UR  - https://pubs.acs.org/doi/10.1021/acs.nanolett.1c02853
UR  - http://hdl.handle.net/10044/1/94053
VL  - 21
ER  -
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