Imperial College London
Professor Richard Syms

ProfessorRichardSyms

Faculty of Engineering, Department of Electrical and Electronic Engineering

Professor
 
 
 
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Contact

 

+44 (0)20 7594 6203r.syms

 
 
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Location

 

702Electrical EngineeringSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Wright:2021:1361-6439/abe247,
author = {Wright, S and Syms, R},
doi = {1361-6439/abe247},
journal = {Journal of Micromechanics and Microengineering},
title = {Shock-free ion transmission in a skimmer-based MEMS mass spectrometer vacuum interface},
url = {http://dx.doi.org/10.1088/1361-6439/abe247},
volume = {31},
year = {2021}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AB  - Shock-free ion transmission from atmospheric pressure to a MEMS-based mass spectrometer has been achieved using micro-engineered nickel skimmers. The signal level has increased 70-fold compared with a previous configuration in which the skimmer did not sample the supersonic flow. The skimmers are formed by electroplating internal surfaces of anisotropically etched, pyramidal holes in (100) silicon. Etching from the reverse of the wafer exposes free- standing, open-ended skimmers supported by remaining silicon. High-resolution schlieren imaging has been used to visualise gas flow within the interface. Signal enhancement and increased gas throughput are observed when the skimmer attaches to the supersonic gas expansion via oblique shocks. The silicon back wall interacts with the flow field, causing the free jet Mach disc to evolve into a bowl-shaped surface shock whose position asymptotically approaches a stand-off separation as the interface pressure decreases. Ideally, the skimmer entrance should be located approximately midway between the inlet and the back wall. This development should allow a sensitivity increase in MEMS mass spectrometers using pumps of moderate capacity.
AU  - Wright,S
AU  - Syms,R
DO  - 1361-6439/abe247
PY  - 2021///
SN  - 0960-1317
TI  - Shock-free ion transmission in a skimmer-based MEMS mass spectrometer vacuum interface
T2  - Journal of Micromechanics and Microengineering
UR  - http://dx.doi.org/10.1088/1361-6439/abe247
UR  - http://hdl.handle.net/10044/1/87072
VL  - 31
ER  -
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