Imperial College London
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Professor Tom Pike

Faculty of Engineering, Department of Electrical and Electronic Engineering

Professor of Microengineering
 
 
 
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Contact

 

+44 (0)20 7594 6207w.t.pike

 
 
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Location

 

604Electrical EngineeringSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Stott:2018:10.1109/JSEN.2018.2871342,
author = {Stott, AE and Charalambous, C and Warren, TJ and Pike, WT},
doi = {10.1109/JSEN.2018.2871342},
journal = {IEEE Sensors Journal},
pages = {9382--9392},
title = {Full-band signal extraction from sensors in extreme environments: the NASA InSight microseismometer},
url = {http://dx.doi.org/10.1109/JSEN.2018.2871342},
volume = {18},
year = {2018}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AB  - Physically meaningful signal extraction from sensors deployed in extreme environments requires a combination of attenuation of confounding inputs and the removal of their residual using decorrelation techniques. In space applications where the resources for physical attenuation are limited, there is a necessity to apply the most effective post-processing analysis available. This paper describes the extraction of the seismic signal from an MEMS microseismometer to be deployed on the surface of Mars. The signal processing, which covers the full bandwidth 1 × 10 -5 Hz to 40 Hz, uses a novel application of sensor fusion through an indirect Kalman Filter in combination with a thermal model of the microseismometer to remove the aseismic contribution of temperature over the frequency range. Owing to the full-band decorrelation, the analysis (based on pre-landing testing in analogous scenarios) produces both a characterization of the microseismomter and a signal processing approach for information retrieval on Mars, along with other planetary and terrestrial planetary deployments.
AU  - Stott,AE
AU  - Charalambous,C
AU  - Warren,TJ
AU  - Pike,WT
DO  - 10.1109/JSEN.2018.2871342
EP  - 9392
PY  - 2018///
SN  - 1530-437X
SP  - 9382
TI  - Full-band signal extraction from sensors in extreme environments: the NASA InSight microseismometer
T2  - IEEE Sensors Journal
UR  - http://dx.doi.org/10.1109/JSEN.2018.2871342
UR  - http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000448514000041&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
UR  - https://ieeexplore.ieee.org/document/8468234
UR  - http://hdl.handle.net/10044/1/69507
VL  - 18
ER  -
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