Imperial College London
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Professor Tom Pike

Faculty of Engineering, Department of Electrical and Electronic Engineering

Professor of Microengineering
 
 
 
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Contact

 

+44 (0)20 7594 6207w.t.pike

 
 
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Location

 

604Electrical EngineeringSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@misc{de:2019,
author = {de, Raucourt S and Lognonné, P and Robert, O and Gabsi, T and Nebut, T and Tillier, S and Parise, M and Llorca, R and Savin, I and Verdier, N and Beucler, E and Drilleau, M and Perrin, C and Kawamura, T and Garcia, R and Murdoch, N and Mimoun, D and Fayon, L and Hurst, K and Wiemer, R and Mance, D and Ten, Pierick J and McClean, J and Pike, W and Zweifel, P and Bierwirth, M},
title = {The Very Broad Band Sensor of SEIS/InSight: Validation from Cruise to Mars Ground},
type = {Poster},
year = {2019}
}
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RIS format (EndNote, RefMan)

TY  - GEN
AU  - de,Raucourt S
AU  - Lognonné,P
AU  - Robert,O
AU  - Gabsi,T
AU  - Nebut,T
AU  - Tillier,S
AU  - Parise,M
AU  - Llorca,R
AU  - Savin,I
AU  - Verdier,N
AU  - Beucler,E
AU  - Drilleau,M
AU  - Perrin,C
AU  - Kawamura,T
AU  - Garcia,R
AU  - Murdoch,N
AU  - Mimoun,D
AU  - Fayon,L
AU  - Hurst,K
AU  - Wiemer,R
AU  - Mance,D
AU  - Ten,Pierick J
AU  - McClean,J
AU  - Pike,W
AU  - Zweifel,P
AU  - Bierwirth,M
PY  - 2019///
TI  - The Very Broad Band Sensor of SEIS/InSight: Validation from Cruise to Mars Ground
ER  -
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