2 results found
Liu X, Duncan A, Gandy A, 2023, Using Perturbation to Improve Goodness-of-Fit Tests based on Kernelized Stein Discrepancy, Fortieth International Conference on Machine Learning
Zhu H, Liu X, Kang R, et al., 2020, Bayesian Probabilistic Numerical Integration with Tree-Based Models, Conference on Neural Information Processing Systems
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