Imperial College London
Portrait Picture

Professor Yoshi Uchida

Faculty of Natural Sciences, Department of Physics

Professor of Physics
 
 
 
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Contact

 

+44 (0)20 7594 7821yoshi.uchida Website

 
 
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Location

 

524Blackett LaboratorySouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Nakazawa:2020:10.1016/j.nima.2019.163247,
author = {Nakazawa, Y and Fujii, Y and Gillies, E and Hamada, E and Igarashi, Y and Lee, M and Moritsu, M and Matsuda, Y and Miyazaki, Y and Nakai, Y and Natori, H and Oishi, K and Sato, A and Uchida, Y and Ueno, K and Yamaguchi, H and Yeo, B and Yoshida, H and Zhang, J},
doi = {10.1016/j.nima.2019.163247},
journal = {Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment},
pages = {1--7},
title = {Radiation hardness study for the COMET Phase-I electronics},
url = {http://dx.doi.org/10.1016/j.nima.2019.163247},
volume = {955},
year = {2020}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AB  - Radiation damage on front-end readout and trigger electronics is an important issue in the COMET Phase-I experiment at J-PARC, which plans to search for the neutrinoless transition of a muon to an electron. To produce an intense muon beam, a high-power proton beam impinges on a graphite target, resulting in a high-radiation environment. We require radiation tolerance to a total dose of 1.0 kGy and 1 MeV equivalent neutron fluence of 1.0 x 10'12 neq  cm-2 including a safety factor of 5 over the duration of the physics measurement. The use of commercially-available electronics components which have high radiation tolerance, if such components can be secured, is desirable in such an environment. The radiation hardness of commercial electronic components has been evaluated in gamma-ray and neutron irradiation tests. As results of these tests, voltage regulators, ADCs, DACs, and several other components were found to have enough tolerance to both gamma-ray and neutron irradiation at the level we require.
AU  - Nakazawa,Y
AU  - Fujii,Y
AU  - Gillies,E
AU  - Hamada,E
AU  - Igarashi,Y
AU  - Lee,M
AU  - Moritsu,M
AU  - Matsuda,Y
AU  - Miyazaki,Y
AU  - Nakai,Y
AU  - Natori,H
AU  - Oishi,K
AU  - Sato,A
AU  - Uchida,Y
AU  - Ueno,K
AU  - Yamaguchi,H
AU  - Yeo,B
AU  - Yoshida,H
AU  - Zhang,J
DO  - 10.1016/j.nima.2019.163247
EP  - 7
PY  - 2020///
SN  - 0168-9002
SP  - 1
TI  - Radiation hardness study for the COMET Phase-I electronics
T2  - Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
UR  - http://dx.doi.org/10.1016/j.nima.2019.163247
UR  - https://www.sciencedirect.com/science/article/pii/S0168900219315220?via%3Dihub
UR  - http://hdl.handle.net/10044/1/76712
VL  - 955
ER  -
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