AN ALIGNMENT METHOD FOR THE MARK II SILICON STRIP VERTEX DETECTOR USING AN X-RAY-BEAM - ADOLPHSEN,C; GRATTA,G; LABARGA,L; LITKE,A; SCHWARZ,A; TURALA,M; ZACCARDELLI,C; BREAKSTONE,A; PARKER,S; BARNETT,B; BOSWELL,C; DAUNCEY,P; et al. (ELSEVIER SCIENCE BV, 1990)