TY - JOUR AU - Kimber,DP AU - Pullar,RC AU - Alford,NM DO - 11/115502 PY - 2008/// SN - 0957-0233 TI - The effects of dielectric loss and tip resistance on resonator <i>Q</i> of the scanning evanescent microwave microscopy (SEMM) probe T2 - MEASUREMENT SCIENCE AND TECHNOLOGY UR - http://dx.doi.org/10.1088/0957-0233/19/11/115502 UR - https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000259826200022&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a2bf6146997ec60c407a63945d4e92bb VL - 19 ER -