TY - JOUR AU - Leem,D-S AU - Woebkenberg,PH AU - Huang,J AU - Anthopoulos,TD AU - Bradley,DDC AU - deMello,JC DO - 10.1016/j.orgel.2010.04.002 EP - 1312 PY - 2010/// SN - 1566-1199 SP - 1307 TI - Micron-scale patterning of high conductivity poly(3,4-ethylendioxythiophene):poly(styrenesulfonate) for organic field-effect transistors T2 - ORGANIC ELECTRONICS UR - http://dx.doi.org/10.1016/j.orgel.2010.04.002 UR - https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000278530500025&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a2bf6146997ec60c407a63945d4e92bb VL - 11 ER -