TY - JOUR AU - Petrov,PK AU - Alford,NMN AU - Gevorgyan,S DO - 2/035 EP - 589 PY - 2005/// SN - 0957-0233 SP - 583 TI - Techniques for microwave measurements of ferroelectric thin films and their associated error and limitations T2 - MEASUREMENT SCIENCE AND TECHNOLOGY UR - http://dx.doi.org/10.1088/0957-0233/16/2/035 UR - https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000227139700036&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a2bf6146997ec60c407a63945d4e92bb VL - 16 ER -