Zeiss Gemini Sigma300 FEG SEM
Zeiss Gemini Sigma300 FEG SEM

The system is a new addition to the electron microscopy suite in Department of Materials. Is has been specifically purchased for the examination of nanoparticles in in secondary electron (SE) and backscattered (BS) imaging conditions.

The High Definition Backscatter Detector (HD BSD) in this FEG SEM allows the researcher to examine samples containing nanoparticles of different phases, dislocation distributions, and very fine grain-size structure.

  • Accelerating Voltage: 0.02 – 30 kV
  • Resolution @ 15 kV: 1.2 nm
  • Resolution @ 1 kV 2.2 nm