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Citation

BibTex format

@article{Dong:2022:10.1002/adts.202200140,
author = {Dong, X and Li, H and Yan, Y and Cheng, H and Zhang, HX and Zhang, Y and Le, TD and Wang, K and Dong, J and Jakobi, M and Yetisen, AK and Koch, AW},
doi = {10.1002/adts.202200140},
journal = {ADVANCED THEORY AND SIMULATIONS},
title = {Deep-Learning-Based Microscopic Imagery Classification, Segmentation, and Detection for the Identification of 2D Semiconductors},
url = {http://dx.doi.org/10.1002/adts.202200140},
year = {2022}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AU  - Dong,X
AU  - Li,H
AU  - Yan,Y
AU  - Cheng,H
AU  - Zhang,HX
AU  - Zhang,Y
AU  - Le,TD
AU  - Wang,K
AU  - Dong,J
AU  - Jakobi,M
AU  - Yetisen,AK
AU  - Koch,AW
DO  - 10.1002/adts.202200140
PY  - 2022///
TI  - Deep-Learning-Based Microscopic Imagery Classification, Segmentation, and Detection for the Identification of 2D Semiconductors
T2  - ADVANCED THEORY AND SIMULATIONS
UR  - http://dx.doi.org/10.1002/adts.202200140
UR  - http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000823996100001&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
ER  -
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