Imperial College London
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ProfessorBaptisteGault

Faculty of Engineering, Department of Materials

Professor of Atomic-Scale Characterization
 
 
 
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Contact

 

b.gault

 
 
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Location

 

Royal School of MinesSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Gault:2010:10.1017/S1431927609991267,
author = {Gault, B and Moody, MP and De, Geuser F and La, Fontaine A and Stephenson, LT and Haley, D and Ringer, SP},
doi = {10.1017/S1431927609991267},
journal = {Microscopy and Microanalysis},
pages = {99--110},
title = {Spatial resolution in atom probe tomography},
url = {http://dx.doi.org/10.1017/S1431927609991267},
volume = {16},
year = {2010}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AB  - This article addresses gaps in definitions and a lack of standard measurement techniques to assess the spatial resolution in atom probe tomography. This resolution is known to be anisotropic, being better in-depth than laterally. Generally the presence of atomic planes in the tomographic reconstruction is considered as being a sufficient proof of the quality of the spatial resolution of the instrument. Based on advanced spatial distribution maps, an analysis methodology that interrogates the local neighborhood of the atoms within the tomographic reconstruction, it is shown how both the in-depth and the lateral resolution can be quantified. The influences of the crystallography and the temperature are investigated, and models are proposed to explain the observed results. We demonstrate that the absolute value of resolution is specimen specific.
AU  - Gault,B
AU  - Moody,MP
AU  - De,Geuser F
AU  - La,Fontaine A
AU  - Stephenson,LT
AU  - Haley,D
AU  - Ringer,SP
DO  - 10.1017/S1431927609991267
EP  - 110
PY  - 2010///
SN  - 1431-9276
SP  - 99
TI  - Spatial resolution in atom probe tomography
T2  - Microscopy and Microanalysis
UR  - http://dx.doi.org/10.1017/S1431927609991267
UR  - http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000274217300011&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=1ba7043ffcc86c417c072aa74d649202
UR  - http://hdl.handle.net/10044/1/65614
VL  - 16
ER  -
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