Imperial College London
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ProfessorBaptisteGault

Faculty of Engineering, Department of Materials

Professor of Atomic-Scale Characterization
 
 
 
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Contact

 

b.gault

 
 
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Location

 

Royal School of MinesSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{Kürnsteiner:2019:10.1017/S1431927619013308,
author = {Kürnsteiner, P and Hariharan, A and Jung, HY and Peter, N and Wilms, MB and Weisheit, A and Barriobero-Vila, P and Gault, B and Raabe, D and Jägle, EA},
doi = {10.1017/S1431927619013308},
journal = {Microscopy and Microanalysis},
pages = {2514--2515},
title = {Application of atom probe tomography to complex microstructures of laser additively manufactured samples},
url = {http://dx.doi.org/10.1017/S1431927619013308},
volume = {25},
year = {2019}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AU  - Kürnsteiner,P
AU  - Hariharan,A
AU  - Jung,HY
AU  - Peter,N
AU  - Wilms,MB
AU  - Weisheit,A
AU  - Barriobero-Vila,P
AU  - Gault,B
AU  - Raabe,D
AU  - Jägle,EA
DO  - 10.1017/S1431927619013308
EP  - 2515
PY  - 2019///
SN  - 1431-9276
SP  - 2514
TI  - Application of atom probe tomography to complex microstructures of laser additively manufactured samples
T2  - Microscopy and Microanalysis
UR  - http://dx.doi.org/10.1017/S1431927619013308
VL  - 25
ER  -
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