Imperial College London
Dr Richard Chater

DrRichardChater

Faculty of Engineering, Department of Materials

Instrumentation Research Fellow, Surface Analysis
 
 
 
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Contact

 

+44 (0)20 7594 6740r.chater

 
 
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Location

 

LG62ARoyal School of MinesSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{McPhail:2011:10.1002/sia.3468,
author = {McPhail, DS and Li, L and Chater, RJ and Yakovlev, N and Seng, H},
doi = {10.1002/sia.3468},
journal = {SURFACE AND INTERFACE ANALYSIS},
pages = {479--483},
title = {From FIB-SIMS to SIMS-FIB. The prospects for a 10 nm lateral resolution SIMS instrument with full FIB functionality},
url = {http://dx.doi.org/10.1002/sia.3468},
volume = {43},
year = {2011}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AU  - McPhail,DS
AU  - Li,L
AU  - Chater,RJ
AU  - Yakovlev,N
AU  - Seng,H
DO  - 10.1002/sia.3468
EP  - 483
PY  - 2011///
SN  - 0142-2421
SP  - 479
TI  - From FIB-SIMS to SIMS-FIB. The prospects for a 10 nm lateral resolution SIMS instrument with full FIB functionality
T2  - SURFACE AND INTERFACE ANALYSIS
UR  - http://dx.doi.org/10.1002/sia.3468
UR  - https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000287669500118&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a2bf6146997ec60c407a63945d4e92bb
VL  - 43
ER  -
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