BibTex format
@article{Lei:2012:10.1364/OE.20.004419,
author = {Lei, DY and Kéna-Cohen, S and Zou, B and Petrov, PK and Sonnefraud, Y and Breeze, J and Maier, SA and Alford, NM},
doi = {10.1364/OE.20.004419},
journal = {Opt. Express},
pages = {4419--4427},
title = {Spectroscopic ellipsometry as an optical probe of strain evolution in ferroelectric thin films},
url = {http://dx.doi.org/10.1364/OE.20.004419},
volume = {20},
year = {2012}
}