Collaborators
Prof. Neil Curson, UCL, UK, Design, fabrication and measurement of single atom electronic devices via electron beam and scanning probe lithography, 2021 - 2024
Andras Kis, EPFL, Switzerland, Beyond CMOS devices, 2013 - 2016
Dr. Armin Knoll, IBM Zurich, The manufacture of single nanometre scale electronic devices, 2013
Francesc Perez-Murano, Spanish National Research Council, Beyond CMOS devices, 2012 - 2016
C. W. Hagen, TU Delft, Neatherlands, Electron beam lithographyCollaborator on FP7 project, 2012 - 2016
Ivo Rangelow, University of Ilmenau, Germany, Beyond CMOS devicesNanoscale lithographic techniques, 2011 - 2016
Arash Mostolfi, Dept. of Material Science, Imperial College London, Thermoelectricity in Si nanowire arrays, 2009 - 2012
Prof. W. I. Milne, University of Cambridge, 2005 - 2009
Prof. S. Uno, RitsumeikanUniversity, Japan, 2005 - 2009
Prof. N. Koshida, Tokyo University of Agriculture and Technology, 2000 - 2009
Prof. S. Oda, Tokyo Institute of Technology, 2000 - 2009
Prof. H Mizuta, University of Southampton, 1997 - 2011
Guest Lectures
Room-temperature single and double quantum dot transistors using dopant atoms, Pakistan Institute of Engineering and Applied Sciences, Islamabad, Pakistan, 2020
Semiconductor quantum-effect devices at the sub-10 nm to atomic scale, University of Southampton, Southampton, UK, 2019
Beyond-CMOS electronics: Semiconductor devices at the sub-10 nm to atomic scale, Pakistan Institute of Engineering and Applied Sciences, Islamabad, Pakistan, 2018
Room Temperature Quantum Dots in Silicon Point-Contact Single-Electron Transistors, National Physical Laboratory, Teddington, UK, 2017
Scanning Probe Lithography approach for beyond CMOS devices, SPIE, San Jose, USA, 2013
Seebeck coefficient in silicon nanowire arrays, Japan Society for the Promotion of Science (JSPS), Tokyo, Japan, 2013
Nanoscale single-electron and quantum dot devices for 'beyond-CMOS' application, Nano-S&T 2012 Conference, Tsingtao, China, 2012
Electron transport and single-electron effects in Si nanocrystals and nanochains, Int. Symp. Atom-scale Si Hybrid Nanotech. "More-than-Moore and beyond", Southampton, U.K., 2010
Transport properties of NeoSilicon materials, JSAP Conference 2009, Toyama, Japan, 2009
Electron conduction and charging effects in silicon nanocrystals, 2nd Int. Workshop on Semiconducting Nanoparticles, Duisberg, Germany, 2008
Electronic transport in silicon nanocrystals and nanochains, Micro and Nanoengineering conference (MNE) 2008, Athens, Greece, 2008
Single-electron transistors, memory and logic in silicon, 2nd Open Workshop on the Fusion of Bio-, Nano- and Semiconductor-Technologies, Osaka, 2005
Single-electron devices in silicon, 2005 Silicon Nanoelectronics Workshop, Kyoto, Japan, 2005
Inter-grain coupling effects on Coulomb oscillations in dual-gated nano crystalline silicon point-contact transistors, Polycrystalline Semiconductors VIII, 2004, Potsdam, Germany, 2004
Research Staff
Li,C
Research Student Supervision
Abualnaja,F, Room Temperature Quantum Dot Transistors in Silicon
He,J, Few-electron transfer devices for single-electron logic applications
He,W, Single electron transistor based gas sensor
Khalafalla,MAH, Electron transport in nanocrystalline silicon: electrostatic and wavefunction interactions
Krali,E, Thermoelectric effects in Si nanowires
Rafiq,A, Electron transport in grown Si nanocrystals and nanochains
Wang,C, Si nanowires for single-electron transistor fabrication
Zadeh,YH, Nanoscale tunnel junctions for IETS measurements
Zaremba-Tymieniecki,M, Field-effect transistors in chemically etched Si nano wires