“Nanoscale Defect Engineering in Graphene: a Combined DFT, TEM Approach”
Many proposed applications of graphene require the ability to tune its electronic structure at the nanoscale. The controlled engineering of defects represents a promising approach to the creation of the desired properties. This approach requires control of defect creation at the atomic scale together with the understanding of how defects impact on the properties of the material.
This talk presents a combined DFT, AC(aberration corrected)-TEM approach to this research topic. Defects are created using an electron beam and imaged by AC-TEM with atomic resolution. The defects observed are then used as input structures for DFT calculations which provide information on the properties arising from the defects.
Results for specific defects such as the carbon mono-vacancy and iron interstitials will be presented.
References:
J. Warner et al., Nature Nanotechnology vol 4, 500 (2009) A. Robertson et al., Nano Lett., vol 13, 1468 (2013) A. Robertson et al, ACS Nano (accepted)