Speaker: Professor Zhi Qiao (Shanghai Tech University)
Title: Advanced X-ray Optical Diagnostics for Synchrotron and Free-Electron Lasers
Abstract: Real-time diagnostics of the temporal and spatial characteristics of beamlines at X-ray light sources, including fourth-generation synchrotron radiation facilities and free-electron lasers, remains a key challenge for large-scale scientific facilities. This talk will present online characterization methods for diffraction-limited X-ray optical components in advanced light sources, real-time beamline wavefront sensing techniques, and their applications in X-ray multi-contrast imaging. I will also introduce single-shot arrival-time diagnostics and real-time single-shot wavefront sensing technologies developed for the Shanghai soft X-ray free-electron laser and high-repetition-rate free-electron laser facilities.