X-ray absorption fine-structure (XAFS) spectroscopy is a powerful element-specific technique, providing electronic and structural information with atomic resolution. Electronic information is extracted from the near-edge XAFS (NEXAFS) spectrum, requiring high spectral resolution to resolve features that occur within a few eV near the absorption edge. Structural information is obtained from the extended XAFS (EXAFS), spreading over several hundred eV above the absorption edge. While XANES and EXAFS are both well-established static methods, crucially lacking so far is the capability of ultrafast transient XAFS; connecting electronic with structural information in real-time. Here, we present a decisive step towards such new methodology based on water-window-covering (280 eV to 540 eV) attosecond soft X-ray (SXR) pulses generated via high-harmonic generation. Using dispersive x-ray opticssuch ultra-broad x-ray pulses give simultaneous access to electronic and lattice parameters. Here, we use such attosecond pulses in a NIR-SXR pump-probe geometry to demonstrate attosecond XAFS (attoXAFS) by studying field-driven inter- and intra-band dynamics in the layered semi-metal TiS2as well as characteristic lattice parameters of highly-orientated pyrolytic graphite.