BibTex format
@article{Bainbridge:2005:10.1016/j.nima.2004.11.050,
author = {Bainbridge, R and Barrillon, P and Hall, G and Leaver, J and Noah, E and Raymond, M and Bisello, D and Candelori, A and Kaminsky, A and Khomenkov, V and Stefanutti, L and Tessaro, M and French, M},
doi = {10.1016/j.nima.2004.11.050},
journal = {NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT},
pages = {619--644},
title = {Production testing and quality assurance of CMS silicon microstrip tracker readout chips},
url = {http://dx.doi.org/10.1016/j.nima.2004.11.050},
volume = {543},
year = {2005}
}
RIS format (EndNote, RefMan)
TY - JOUR
AU - Bainbridge,R
AU - Barrillon,P
AU - Hall,G
AU - Leaver,J
AU - Noah,E
AU - Raymond,M
AU - Bisello,D
AU - Candelori,A
AU - Kaminsky,A
AU - Khomenkov,V
AU - Stefanutti,L
AU - Tessaro,M
AU - French,M
DO - 10.1016/j.nima.2004.11.050
EP - 644
PY - 2005///
SN - 0168-9002
SP - 619
TI - Production testing and quality assurance of CMS silicon microstrip tracker readout chips
T2 - NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
UR - http://dx.doi.org/10.1016/j.nima.2004.11.050
VL - 543
ER -