In this section
@inproceedings{Medeiros:2013:10.1149/05326.0001ecst,
author = {Medeiros, MCR and Martinez-Domingo, C and Ramon, E and Negrier, AT and Sowade, E and Mitra, KY and Baumann, RR and McCulloch, I and Carrabina, J and Gomes, HL},
doi = {10.1149/05326.0001ecst},
pages = {1--10},
title = {Inkjet-printed organic electronics: Operational stability and reliability issues},
url = {http://dx.doi.org/10.1149/05326.0001ecst},
year = {2013}
}
TY - CPAPER
AB - The operational stability of all-inkjet printed transistors is reported. At room temperature the threshold voltage shifts following a stretched exponential with a relaxation time τ=1×10<sup>3</sup> s. Two distinct trap sites active in different temperature ranges, one at 200-250 K and other above 310 K cause the electrical instability. Both types of traps capture holes and can be fast neutralized by photogenerated electrons. Optically induced detrapping currents confirm the differences in trap signature. It is proposed, that the traps have a common physical origin related to water. © The Electrochemical Society.
AU - Medeiros,MCR
AU - Martinez-Domingo,C
AU - Ramon,E
AU - Negrier,AT
AU - Sowade,E
AU - Mitra,KY
AU - Baumann,RR
AU - McCulloch,I
AU - Carrabina,J
AU - Gomes,HL
DO - 10.1149/05326.0001ecst
EP - 10
PY - 2013///
SN - 1938-5862
SP - 1
TI - Inkjet-printed organic electronics: Operational stability and reliability issues
UR - http://dx.doi.org/10.1149/05326.0001ecst
ER -