BibTex format
@article{Gomes:2015:10.1016/j.microrel.2015.05.006,
author = {Gomes, HL and Medeiros, MCR and Villani, F and Canudo, J and Loffredo, F and Miscioscia, R and Martinez-Domingo, C and Ramon, E and Sowade, E and Mitra, KY and Baumann, RR and McCulloch, I and Carrabina, J},
doi = {10.1016/j.microrel.2015.05.006},
journal = {MICROELECTRONICS RELIABILITY},
pages = {1192--1195},
title = {All-inkjet printed organic transistors: Dielectric surface passivation techniques for improved operational stability and lifetime},
url = {http://dx.doi.org/10.1016/j.microrel.2015.05.006},
volume = {55},
year = {2015}
}
RIS format (EndNote, RefMan)
TY - JOUR
AU - Gomes,HL
AU - Medeiros,MCR
AU - Villani,F
AU - Canudo,J
AU - Loffredo,F
AU - Miscioscia,R
AU - Martinez-Domingo,C
AU - Ramon,E
AU - Sowade,E
AU - Mitra,KY
AU - Baumann,RR
AU - McCulloch,I
AU - Carrabina,J
DO - 10.1016/j.microrel.2015.05.006
EP - 1195
PY - 2015///
SN - 0026-2714
SP - 1192
TI - All-inkjet printed organic transistors: Dielectric surface passivation techniques for improved operational stability and lifetime
T2 - MICROELECTRONICS RELIABILITY
UR - http://dx.doi.org/10.1016/j.microrel.2015.05.006
UR - https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000360867200009&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a2bf6146997ec60c407a63945d4e92bb
VL - 55
ER -