Cameca LEAP 5000 XR
The Local Electrode Atom Probe (LEAP 5000) allows nanoscale analysis of typical volumes of 50 nm x 50 nm x 100 nm with ppm compositional sensitivity and up to 0.2 nm spatial resolution in the analysis direction. It is equipped with a high frequency laser pulsing system, allowing the analysis of non-conductive materials and insulators and an energy compensating lens for optimal mass resolving power. Atom probe microscopy can detect all elements equally (including hydrogen) and allows 3D reconstructions of nanoscale segregation within sample volumes. The LEAP 5000XR is fitted with a FerroVac cryo/vacuum transfer suitcase which is able to dock directly with the Hydra DualBeam and the glovebox for movement of environmentally sensitive samples.
Scientific Helios Hydra DualBeam
Thermofisher Scientific Helios Hydra DualBeam with cryo-stage
The Hydra DualBeam combines a multi-source plasma column (Xe, N, O, Ar) with a high-resolution electron column with insertable backscatter and STEM detectors. The high current plasma source allows high volume milling at rates orders of magnitude greater than that of conventional gallium sources, giving significant improvements in throughput. The system is equipped with a cryo capable stage and cryo manipulator which will allow the liftout of materials that require a constant cryogenic temperature such as frozen liquid/solid interfaces. The Hydra DualBeam is fitted with a FerroVac cryo/vacuum transfer suitcase which is able to dock directly with the LEAP 5000XR and the glovebox for movement of environmentally sensitive samples.
The glovebox system consists of a chamber with an inert (N2) atmosphere, with a large loadlock for large samples and materials and a dock for a FerroVac cryo/vacuum transfer suitcase. This allows the mounting of materials for analysis and FIB, atom probe and TEM sample holders for subsequent transfer into their respective instruments using the FerroVac suitcase or other suitable method. These inert gas operations can be carried out at cryo temperature as well as room temperature if required. The glovebox is to be installed later in 2021.
Spectra 300 Scanning Transmission Electron Microscope X-FEG/UltiMono
Access to atomic information: The Department of Materials Spectra 300 is a probe corrected Scanning Transmission Electron Microscope (TEM), equipped with an ultra-high-resolution X-FEG Ulti-monochromator. The ultimate STEM spatial resolution is 50 pm @300 kV, allowing users to observe even slit shifts in atomic positions within unit cells, such as the octahedral tilting of oxides.
Atomic resolution elemental analysis: The Spectra TEM is equipped with a Dual-X energy dispersive X-ray (EDX) detector and an in-situ Gatan Continuum K3 (80-300 kV) with switchable FXUP camera for lower kV experiments (60-300 kV).
The X-FEG/Mono can be automatically tuned from 1 eV down to 0.2 eV, while the X-FEG/UltiMono can be automatically tuned from 1 eV down to <30 meV, allowing for the measurement of local bandgap changes within material interfaces.
Electron diffraction: The Spectra TEM has been set up for 4D-STEM using either the Ceta camera or the K3 direct electron detector. Lorentz mode STEM alignments allow users to conduct electron diffraction experiments also within a ‘field free’ environment that is essential for most magnetic samples. The Nanomegas additional equipment and software can be used to for precision electron diffraction experiments.
Cryogenic and In-situ TEM Holders: Several cryogenic and in-situ related TEM holders are part of the suite, including Gatan Liquid nitrogen (LN2) Cryogenic transfer single tilt, Gatan double tilt LN2 holder, Melbuild LN2 Cooling, Double Tilt and Vacuum Transfer TEM holder, in-situ DENSsolutions cooling and biasing holder, in-situ DENSsolutions Stream liquid and biasing or heating holder, in-situ Protochips heating and biasing holder.