BibTex format
@inproceedings{ADOLPHSEN:1990:10.1016/0168-9002(90)90496-S,
author = {ADOLPHSEN, C and GRATTA, G and LABARGA, L and LITKE, A and SCHWARZ, A and TURALA, M and ZACCARDELLI, C and BREAKSTONE, A and PARKER, S and BARNETT, B and BOSWELL, C and DAUNCEY, P and DREWER, D and MATTHEWS, J and VEJCIK, S and JACOBSEN, R and LUTH, V},
doi = {10.1016/0168-9002(90)90496-S},
pages = {257--264},
publisher = {ELSEVIER SCIENCE BV},
title = {AN ALIGNMENT METHOD FOR THE MARK II SILICON STRIP VERTEX DETECTOR USING AN X-RAY-BEAM},
url = {http://dx.doi.org/10.1016/0168-9002(90)90496-S},
year = {1990}
}
RIS format (EndNote, RefMan)
TY - CPAPER
AU - ADOLPHSEN,C
AU - GRATTA,G
AU - LABARGA,L
AU - LITKE,A
AU - SCHWARZ,A
AU - TURALA,M
AU - ZACCARDELLI,C
AU - BREAKSTONE,A
AU - PARKER,S
AU - BARNETT,B
AU - BOSWELL,C
AU - DAUNCEY,P
AU - DREWER,D
AU - MATTHEWS,J
AU - VEJCIK,S
AU - JACOBSEN,R
AU - LUTH,V
DO - 10.1016/0168-9002(90)90496-S
EP - 264
PB - ELSEVIER SCIENCE BV
PY - 1990///
SN - 0168-9002
SP - 257
TI - AN ALIGNMENT METHOD FOR THE MARK II SILICON STRIP VERTEX DETECTOR USING AN X-RAY-BEAM
UR - http://dx.doi.org/10.1016/0168-9002(90)90496-S
UR - https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:A1990CR03600044&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a2bf6146997ec60c407a63945d4e92bb
ER -