In this section
@article{Yun:2021:10.1002/smtd.202001264,
author = {Yun, D-J and Lee, S and Kim, SH and Jung, C and Kim, YS and Chung, JG and Heo, S and Kwon, Y-N and Lee, E and Kim, J-S and Ko, D-S and Kim, SY},
doi = {10.1002/smtd.202001264},
journal = {SMALL METHODS},
title = {Bevel Structure Based XPS Analysis as a Non-Destructive Chemical Probe for Complex Interfacial Structures of Organic Semiconductors},
url = {http://dx.doi.org/10.1002/smtd.202001264},
volume = {5},
year = {2021}
}
TY - JOUR
AU - Yun,D-J
AU - Lee,S
AU - Kim,SH
AU - Jung,C
AU - Kim,YS
AU - Chung,JG
AU - Heo,S
AU - Kwon,Y-N
AU - Lee,E
AU - Kim,J-S
AU - Ko,D-S
AU - Kim,SY
DO - 10.1002/smtd.202001264
PY - 2021///
SN - 2366-9608
TI - Bevel Structure Based XPS Analysis as a Non-Destructive Chemical Probe for Complex Interfacial Structures of Organic Semiconductors
T2 - SMALL METHODS
UR - http://dx.doi.org/10.1002/smtd.202001264
UR - https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000638668400001&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a2bf6146997ec60c407a63945d4e92bb
VL - 5
ER -
