Model: Janis Microwave (MW) Cryo Probe Station

The Microwave (MW) Cryo-probe Station is designed to provide affordable vacuum and cryogenic probing of wafers and devices.  The on-wafer measurements could be performed under external electrical bias, and magnetic field (up to 0.15 T) applied in horizontal or vertical directions, in wide temperature (10 K – 600 K) and frequency (d.c. – 65 GHz) ranges.  The system can be used in various fields, including superconductivity, MEMS, ferroelectrics, nanoscale electronics, material sciences, and optics.

Model: Signatone S-1160

The room-temperature probe station is used to perform electrical measurements on devices at room temperature; ideal equipment for a multi-purpose analytical platform. It can be used to probe small or large geometries by fitting with either high- or low-powered optics.  It is also designed to support various precision probing applications, including MCMs, hybrids and wafers. It is also compatible with magnetic and vacuum base micro-positioners.  In addition, it has a purpose-built heating stage that allows measurement at temperatures up to 250°C with 0.1°C accuracies.

Model: Keysight B1500A

The Semiconductor Analyser provides a wide range of measurement capabilities to cover the electrical characterisation and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other electronic device with uncompromised measurement reliability and efficiency. It provides a wide range of measurement capabilities to cover the electrical characterisation and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other electronic device with uncompromised measurement reliability and efficiency.

Model: Agilent 4287A RF LCR Meter

The 4287A RF LCR Meter offers accurate, reliable and fast measurements from 1 MHz to 3 GHz to improve the quality and throughput of electronic component testing in production lines. The 4287A employs the direct-current voltage-measurement technique instead of the reflection-measurement technique, which yields accurate measurements over a wide impedance range.

Model: Keysight P5008A Vector Network Analyser 100 kHz - 53 GHz

This is a flexible, high-performance, compact VNA that provides a frequency range of 100 kHz to 53 GHz. It allows a wide range of measurement applications to gain deeper insight into your RF test.

It features the same intuitive GUI as Keysight’s high-performance PNAs.

Keithley’s Series 2600B System SMU instruments are the industry standard current-voltage source and measure solution for highly automated production test applications. Both dual- and single-channel models tightly integrate a precision power supply, accurate current source, DMM, and electronic load with a pulse generating capabilities. Plus, TSP® technology runs complete test programs for automated system applications, and TSP-Link® technology enables daisy-chaining up to 64 channels for high-volume parallel tests.

Model: Keysight B1500A

It provides a wide range of measurement capabilities to cover the electrical characterisation and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other electronic device with uncompromised measurement reliability and efficiency.

It provides a wide range of measurement capabilities to cover the electrical characterisation and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other electronic device with uncompromised measurement reliability and efficiency.